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JANČA, M. ŠILER, P. OPRAVIL, T. KOTRLA, J.
Original Title
Determination accuracy of analysis refractory materials by x-ray fluorescence
Type
conference paper
Language
English
Original Abstract
This work was focused on the finding of the right way how to analyze refractory materials by X-ray fluorescence. This method can provide accurate results which can be easily repeated, what is the reason why this method is commonly used in industry. Using of the fluorescent spectrometric analysis comes with one issue, which is the presence of many distorting interferences. From this particular reason it is necessary to identify these interferences and then find the ideal solution for their elimination. The choosing of the right method of sample preparation is basic point for making of well analyze results. The differences are shown on the refractory materials samples. All the values were compared according to standards compositions. In this case we compare different conditions of measurement, under air and vacuum. And different preparation form in powder or fusion into pearl.
Keywords
X-ray fluorescence, refractory, fusion
Authors
JANČA, M.; ŠILER, P.; OPRAVIL, T.; KOTRLA, J.
Released
12. 7. 2018
Publisher
IOP Publishing
Location
Češkovice
ISBN
1757-899X
Periodical
IOP Conference Series: Materials Science and Engineering
Year of study
379
State
United Kingdom of Great Britain and Northern Ireland
Pages from
1
Pages to
7
Pages count
URL
http://iopscience.iop.org/article/10.1088/1757-899X/379/1/012034
Full text in the Digital Library
http://hdl.handle.net/11012/84145
BibTex
@inproceedings{BUT148518, author="Martin {Janča} and Pavel {Šiler} and Tomáš {Opravil} and Jan {Kotrla}", title="Determination accuracy of analysis refractory materials by x-ray fluorescence", booktitle="IOP Conference Series: Materials Science and Engineering", year="2018", journal="IOP Conference Series: Materials Science and Engineering", volume="379", pages="1--7", publisher="IOP Publishing", address="Češkovice", doi="10.1088/1757-899X/379/1/012034", issn="1757-899X", url="http://iopscience.iop.org/article/10.1088/1757-899X/379/1/012034" }