Publication detail

Protection Against PID Degradation at Photovoltaic Cell Level

HYLSKÝ, J. STRACHALA, D. ČUDEK, P. VANĚK, J.

Original Title

Protection Against PID Degradation at Photovoltaic Cell Level

Type

conference paper

Language

English

Original Abstract

Nowadays, we find many scientific papers dealing with the potential induced degradation, in which authors attempt to achieve PID resistive photovoltaic cells. This work deals with the electrical properties of the newly created P-type photovoltaic cell. The IV-characteristics and external quantum efficiency of the newly created and reference samples are compared. To verify the resistivity of the newly created photovoltaic cell against PID, both samples were artificially degraded

Keywords

Potential Induced Degradation

Authors

HYLSKÝ, J.; STRACHALA, D.; ČUDEK, P.; VANĚK, J.

Released

9. 11. 2018

Publisher

ECS Transaction

Location

Brno

ISBN

978-1-60768-864-8

Book

ECS Transactions

Edition

87

Edition number

1

ISBN

1938-5862

Periodical

ECS Transactions

Year of study

87

Number

1

State

United States of America

Pages from

221

Pages to

225

Pages count

5

URL

https://iopscience.iop.org/article/10.1149/08701.0221ecst/pdf

BibTex

@inproceedings{BUT150479,
  author="Josef {Hylský} and Dávid {Strachala} and Pavel {Čudek} and Jiří {Vaněk}",
  title="Protection Against PID Degradation at Photovoltaic Cell Level",
  booktitle="ECS Transactions",
  year="2018",
  series="87",
  journal="ECS Transactions",
  volume="87",
  number="1",
  pages="221--225",
  publisher="ECS Transaction",
  address="Brno",
  doi="10.1149/08701.0221ecst",
  isbn="978-1-60768-864-8",
  issn="1938-5862",
  url="https://iopscience.iop.org/article/10.1149/08701.0221ecst/pdf"
}