Publication detail

Reduction of metal artefacts in CT data with submicron resolution using dual-target CT

VÍTEČEK, J. ŠALPLACHTA, J.

Original Title

Reduction of metal artefacts in CT data with submicron resolution using dual-target CT

Type

conference paper

Language

English

Original Abstract

The article deals with the possibility of the metal artefact reduction in computed tomography (CT) data with submicron resolution using dual-target CT. The sample is scanned twice at different acquisition parameters, at two different energy spectra. Dual-energy data are then used for easier localisation and segmentation of metal areas and the final combination of low and high-density materials. The final images are compared with the projection-based metal artefact reduction (MAR) algorithm and the commercial program VGStudio MAX 3.1. The results show good functionality of the proposed method and potential for further development.

Keywords

X-ray computed tomography, Nanotomography, Submicron resolution, CT images artefacts, Reduction of metal artefacts, Dual-Target CT

Authors

VÍTEČEK, J.; ŠALPLACHTA, J.

Released

25. 4. 2019

Publisher

Brno University of Technology

Location

Brno

ISBN

978-80-214-5735-5

Book

Proceedings of the 25th Conference STUDENT EEICT 2019

Edition number

první

Pages from

394

Pages to

397

Pages count

4

URL

http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf

BibTex

@inproceedings{BUT156889,
  author="Jiří {Víteček} and Jakub {Šalplachta}",
  title="Reduction of metal artefacts in CT data with submicron resolution using dual-target CT",
  booktitle="Proceedings of the 25th Conference STUDENT EEICT 2019",
  year="2019",
  number="první",
  pages="394--397",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-5735-5",
  url="http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf"
}