Publication detail

An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference

KROLÁK, D. HORSKÝ, P. PLOJHAR, J.

Original Title

An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference

Type

journal article in Web of Science

Language

English

Original Abstract

This article proposes an electromagnetic compatibility improved bandgap voltage reference with a low current consumption of only 3.5 uA in an automotive environment with a wide temperature range from -40 degrees C to 160 degrees C and a high electromagnetic interference (EMI) robustness. The proposed reference is based on the well-known Brokaw bandgap with only five bipolar transistors in the bandgap core including collector current leakage compensation. We analyzed parasitic effects in the bandgap core such as the influence of parasitic capacitances between the substrate and the collectors of these bipolar transistors as well as the impact of the operational amplifier. We made recommendations on how to improve the bandgap EMI robustness. Simulation results were compared with measurements on a test chip. The measurement results showed excellent EMI robustness.

Keywords

Bandgap; Electromagnetic interference; Substrates; Bipolar transistors; Capacitors; Capacitance; Integrated circuits; Bandgap reference; Bandgap voltage reference; Brokaw bandgap voltage reference; Electromagnetic compatibility; Electromagnetic interference (EMI); Voltage reference

Authors

KROLÁK, D.; HORSKÝ, P.; PLOJHAR, J.

Released

3. 1. 2020

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Location

Piscataway

ISBN

0018-9375

Periodical

IEEE Transaction on Electromagnetic Compatibility

Year of study

62

Number

5

State

United States of America

Pages from

2277

Pages to

2284

Pages count

8

URL

BibTex

@article{BUT157458,
  author="David {Krolák} and Pavel {Horský} and Jan {Plojhar}",
  title="An Automotive Low-Power EMC Robust Brokaw Bandgap Voltage Reference",
  journal="IEEE Transaction on Electromagnetic Compatibility",
  year="2020",
  volume="62",
  number="5",
  pages="2277--2284",
  doi="10.1109/TEMC.2019.2958926",
  issn="0018-9375",
  url="https://ieeexplore.ieee.org/document/8949821"
}