Publication detail

VANĚK, J., KAZELLE, J., BRZOKOUPIL, V., CHOBOLA, Z.

Type

conference paper

Original Abstract

Low-frequency Noise Measurements used for semiconductors light active devices

Keywords

Low-frequency Noise Measurements used for semiconductors light active devices

Authors

VANĚK, J., KAZELLE, J., BRZOKOUPIL, V., CHOBOLA, Z.

Released

13. 9. 2005

Publisher

Vysoké učení technické

Location

Texas

ISBN

0-8194-5839-2

Book

Proceedings of the Conference Noise in Devices and Circuits III

Pages to

43

BibTex

@inproceedings{BUT15798,
  author="Jiří {Vaněk} and Zdeněk {Chobola} and Vladimír {Brzokoupil} and Jiří {Kazelle}",
  booktitle="Proceedings of the Conference Noise in Devices and Circuits III",
  year="2005",
  publisher="Vysoké učení technické",
  address="Texas",
  isbn="0-8194-5839-2"
}