Publication detail

Advanced structural analysis of silicon solar cells

PAPEŽ, N.

Original Title

Advanced structural analysis of silicon solar cells

Type

conference paper

Language

English

Original Abstract

The study investigates the structural imperfections of photovoltaic cells based on polycrystalline silicon. Experimental characterization focuses in particular on the degradation and defects analysis. Two modern techniques were used – scanning electron microscopy (SEM) with electron beam-induced current (EBIC) and 3D digital optical microscopy. The properties and range of cell defects that can significantly affect its function were characterized with this inspection and failure analysis.

Keywords

SEM, EBIC, optical microscopy, solar cells, defects

Authors

PAPEŽ, N.

Released

25. 4. 2019

Location

Brno

ISBN

978-80-214-5735-5

Book

Proceedings of the 25th Conference STUDENT EEICT 2019

Edition number

1

Pages from

723

Pages to

727

Pages count

5

URL

http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf

BibTex

@inproceedings{BUT158022,
  author="Nikola {Papež}",
  title="Advanced structural analysis of silicon solar cells",
  booktitle="Proceedings of the 25th Conference STUDENT EEICT 2019",
  year="2019",
  number="1",
  pages="723--727",
  address="Brno",
  isbn="978-80-214-5735-5",
  url="http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf"
}