Publication detail

Application of new measurement method to integrated capacitor characterization

Sutorý, T.

Original Title

Application of new measurement method to integrated capacitor characterization

Type

conference paper

Language

English

Original Abstract

A new measurement method has been developed for non-linear integrated capacitor characterization. The paper deals with its application on a test-chip with some test structures of capacitors. The test chip serves for research into methods of nonlinear gate capacitance compensation.

Key words in English

measurement, characterization, compensation, non-linear capacitors, MOS transistors

Authors

Sutorý, T.

RIV year

2005

Released

1. 1. 2005

Publisher

Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno

Location

Brno

ISBN

80-214-3089-3

Book

Moderní metody řešení, návrhu a aplikace elektronických obvodů

Edition number

první

Pages from

65

Pages to

70

Pages count

6

URL

http://www.urel.feec.vutbr.cz/sbornikH105.pdf

BibTex

@inproceedings{BUT16029,
  author="Tomáš {Sutorý}",
  title="Application of new measurement method to integrated capacitor characterization",
  booktitle="Moderní metody řešení, návrhu a aplikace elektronických obvodů",
  year="2005",
  number="první",
  pages="6",
  publisher="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  address="Brno",
  isbn="80-214-3089-3",
  url="http://www.urel.feec.vutbr.cz/sbornikH105.pdf"
}