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KADLEC, P. MAREK, M. ŠTUMPF, M.
Original Title
Lightning Stroke Localization – A Time-Domain Approach Based on Evolutionary Optimization
Type
journal article in Web of Science
Language
English
Original Abstract
In the present paper we analyze a localization problem based on evolutionary optimization algorithms and an analytical EM-field-to-line coupling model. A computationally efficient, analytical model for calculating time-domain lightninginduced voltages serves as the forward solver in the optimization process. The model takes into account electric permittivity and conductivity of a lossy ground. The inverse problem is solved with the aid of a single-objective global optimization algorithm. It is demonstrated that the Covariant Matrix Adaptation - Evolution Strategy algorithm shows the best performance among considered state-of-the-art algorithms. The influence of other problem parameters, e.g. the size of the search space, the fluctuation of the return-stroke pulse width and amplitude, and the presence of noise, on the localization error is discussed. While the growing size of the search domain has a significant impact on the convergence properties of the optimization process, this is not the case for the signal distortion, whose influence can be virtually neglected.
Keywords
Lightning Stroke, Transmission Line, Evolutionary Optimization, Time-Domain Analysis
Authors
KADLEC, P.; MAREK, M.; ŠTUMPF, M.
Released
22. 1. 2020
ISBN
0018-9375
Periodical
IEEE Transaction on Electromagnetic Compatibility
Year of study
62
Number
5
State
United States of America
Pages from
2111
Pages to
21188
Pages count
8
URL
https://ieeexplore.ieee.org/document/8966283
BibTex
@article{BUT161030, author="Petr {Kadlec} and Martin {Marek} and Martin {Štumpf}", title="Lightning Stroke Localization – A Time-Domain Approach Based on Evolutionary Optimization", journal="IEEE Transaction on Electromagnetic Compatibility", year="2020", volume="62", number="5", pages="2111--21188", doi="10.1109/TEMC.2020.2964059", issn="0018-9375", url="https://ieeexplore.ieee.org/document/8966283" }