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PAPEŽ, N. DALLAEV, R. SOBOLA, D. MACKŮ, R. ŠKARVADA, P.
Original Title
Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method
Type
conference paper
Language
English
Original Abstract
This work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method.
Keywords
ebic; structural analysis; solar cells; defects
Authors
PAPEŽ, N.; DALLAEV, R.; SOBOLA, D.; MACKŮ, R.; ŠKARVADA, P.
Released
19. 2. 2020
Publisher
Elsevier
ISBN
2452-3216
Periodical
Procedia Structural Integrity
Year of study
23
Number
1
State
Republic of Italy
Pages from
595
Pages to
600
Pages count
6
URL
https://www.sciencedirect.com/science/article/pii/S2452321620302183
Full text in the Digital Library
http://hdl.handle.net/11012/193483
BibTex
@inproceedings{BUT161694, author="Nikola {Papež} and Rashid {Dallaev} and Dinara {Sobola} and Robert {Macků} and Pavel {Škarvada}", title="Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method", booktitle="Procedia Structural Integrity", year="2020", journal="Procedia Structural Integrity", volume="23", number="1", pages="595--600", publisher="Elsevier", doi="10.1016/j.prostr.2020.01.151", issn="2452-3216", url="https://www.sciencedirect.com/science/article/pii/S2452321620302183" }