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ŠRÁMEK, J. JANKOVÝCH, R.
Original Title
MEASUREMENT UNCERTAINTY SIMULATION BY MONTE CARLO METHOD IN NANOMETROLOGY
Type
journal article in Web of Science
Language
English
Original Abstract
This paper deals with the determination of uncertainty and individual contributions to the measurement uncertainty on the CMM SIOS NNM-1 instrument fitted with the touch-probe scanning system Gannen XP. Manufacturer SIOS designates this machine as nano-CMM. Two non-simulation methods to determine the measurement uncertainty, the substitution and multi-position methods are addressed in detail [Sramek, Jankovych 2018]. Ruby balls with various nominal diameters are used as the measured objects. One simulation method to determine the measurement uncertainty, the Monte Carlo method, is also addressed in this paper. The paper also summarizes and specifies calculation methods to determine the measurement uncertainty, and provides results of representative sets of measurements, including determination of the expanded measurement uncertainty. This paper contains novel conclusions in the area of uncertainty measurement of nano-CMMs.
Keywords
accuracy of measurement, length measurement, measurement repeatability, measurement reproducibility, measurement uncertainty, measuring device, nanometrology, ruby ball
Authors
ŠRÁMEK, J.; JANKOVÝCH, R.
Released
1. 10. 2019
Publisher
Modern Machinery (MM) Science Journal
Location
ČR
ISBN
1805-0476
Periodical
MM Science Journal
Year of study
Oct 2019
Number
3
State
Czech Republic
Pages from
2998
Pages to
3004
Pages count
6
URL
https://www.mmscience.eu/journal/issues/October%202019/articles/measurement-uncertainty-simulation-by-monte-carlo-method-in-nanometrology
BibTex
@article{BUT162066, author="Jan {Šrámek} and Róbert {Jankových}", title="MEASUREMENT UNCERTAINTY SIMULATION BY MONTE CARLO METHOD IN NANOMETROLOGY", journal="MM Science Journal", year="2019", volume="Oct 2019", number="3", pages="2998--3004", doi="10.17973/MMSJ.2019\{_}10\{_}2018112", issn="1805-0476", url="https://www.mmscience.eu/journal/issues/October%202019/articles/measurement-uncertainty-simulation-by-monte-carlo-method-in-nanometrology" }