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HÉGR, O. BOUŠEK, J.
Original Title
Depozice pasivačních vrstev SiNx a SiO2.
English Title
Deposition of SiNx and SiO2 passivation layers.
Type
conference paper
Language
Czech
Original Abstract
In the semiconductor and photovoltaic application, the surface passivation is a very important process for adjustment of silicon surface properties. It brings reduction of recombination centers that arise from previous technology steps. The surface recombination is decreased and the effective lifetime is increased. For passivation layers deposition more methods are possible. The most important method is PECVD (Plasma-Enhanced Chemical Vapor Deposition) and LPCVD (Low-Pressure Chemical Vapor Deposition). In this paper, deposition of the passivation layers by means of reactive magnetron sputtering is dealt.
English abstract
Keywords
povrchová pasivace, solární články, depozice SiN
Key words in English
surface passivation, deposition
Authors
HÉGR, O.; BOUŠEK, J.
RIV year
2005
Released
12. 12. 2005
Publisher
nakl. Z. Novotný
Location
Brno
ISBN
80-214-3116-4
Book
Mikrosyn. Nové trendy v mikroelektronických systémech a nanotechnologiích
Edition number
1
Pages from
111
Pages to
116
Pages count
6
BibTex
@inproceedings{BUT16434, author="Ondřej {Hégr} and Jaroslav {Boušek}", title="Depozice pasivačních vrstev SiNx a SiO2.", booktitle="Mikrosyn. Nové trendy v mikroelektronických systémech a nanotechnologiích", year="2005", volume="2005", number="1", pages="6", publisher="nakl. Z. Novotný", address="Brno", isbn="80-214-3116-4" }