Publication detail

Electrical Impedance Tomography-Based Spatial Reconstruction of Admittivity in a Cylindrical Object

DUŠEK, J. MIKULKA, J.

Original Title

Electrical Impedance Tomography-Based Spatial Reconstruction of Admittivity in a Cylindrical Object

Type

conference paper

Language

English

Original Abstract

The paper discusses experimental measurement, simulation, validation, and reconstruction of complex admittivity, with all of the steps performed by utilizing electrical impedance tomography. After a brief introduction, the main aspects of the research are characterized, including the principle of the forward problem, in which the complete electrode model is embedded; the basics of the inverse problem, comprising an objective function solved with the Gauss-Newton method; and the impact of the objective function`s regularization. The 8-electrode measuring configuration and the simulation environment are described in detail, as they facilitate the reconstruction process. The experiment-related portion of the paper outlines the measured voltages and phases for the homogeneous and inhomogeneous admittivity distribution inside the tomograph. Based on the measurement results, we reconstructed the image of the real and imaginary parts of the admittivity, using the EIDORS library to support the procedure. The obtained components were evaluated and compared with the actual position of the inserted object. The final images show that the determinability of the inhomogeneity position has generally improved through exploiting the real part of the complex admittivity; simultaneously, however, the stability of the imaginary part has visibly decreased.

Keywords

Electrical Impedance Tomography, complex admittivity, admittivity reconstruction

Authors

DUŠEK, J.; MIKULKA, J.

Released

4. 12. 2020

Publisher

IEEE345 E 47TH ST, NEW YORK, NY 10017 USA

Location

USA

ISBN

978-1-7281-5601-9

Book

Proceedings of the 2020 19th International Conference on Mechatronics – Mechatronika (ME)

Edition

1

Pages from

114

Pages to

119

Pages count

6

URL

https://ieeexplore.ieee.org/document/9286467

BibTex

@inproceedings{BUT166327,
  author="Jan {Dušek} and Jan {Mikulka}",
  title="Electrical Impedance Tomography-Based Spatial Reconstruction of Admittivity in a Cylindrical Object",
  booktitle="Proceedings of the 2020 19th International Conference on Mechatronics – Mechatronika (ME)",
  year="2020",
  series="1",
  pages="114--119",
  publisher="IEEE345 E 47TH ST, NEW YORK, NY 10017 USA",
  address="USA",
  doi="10.1109/ME49197.2020.9286467",
  isbn="978-1-7281-5601-9",
  url="https://ieeexplore.ieee.org/document/9286467"
}