Publication detail

Noise Spectral Density and Reliability of Tantalum Capacitors

ŠIKULA, J., KOKTAVÝ, B., HRUŠKA, P., VAŠINA, P., KOKTAVÝ, P., HÁJEK, K.

Original Title

Noise Spectral Density and Reliability of Tantalum Capacitors

Type

conference paper

Language

English

Original Abstract

Noise Spectral Density and Reliability of Tantalum Capacitors

Key words in English

tantalum capacitor, reliability, noise

Authors

ŠIKULA, J., KOKTAVÝ, B., HRUŠKA, P., VAŠINA, P., KOKTAVÝ, P., HÁJEK, K.

Released

24. 3. 1997

Location

Florida, USA

Pages from

298

Pages to

303

Pages count

6

BibTex

@inproceedings{BUT16648,
  author="Josef {Šikula} and Bohumil {Koktavý} and Pavel {Hruška} and Pavel {Vašina} and Pavel {Koktavý} and Karel {Hájek}",
  title="Noise Spectral Density and Reliability of Tantalum Capacitors",
  booktitle="17th Capacitor and Resistor Technology Symposium CARTS’97",
  year="1997",
  pages="6",
  address="Florida, USA"
}