Publication detail

Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers

DAGHBOUJ, N. CALLISTI, M. SEN, H. S. KARLIK, M. ČECH, J. VRONKA, M. HAVRÁNEK, V. ČAPEK, J. MINÁRIK, P. BÁBOR, P. POLCAR, T.

Original Title

Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers

Type

journal article in Web of Science

Language

English

Original Abstract

Sputter-deposited Zr/Nb nanoscale metallic multilayers with a periodicity of 27 (thin) and 96 nm (thick) were subjected to Cu + implantation with low and high fluences and then studied using various experimental techniques in combination with DFT calculations. After Cu + implantation, the thinner multilayer exhibited a tensile strain along c-axis in Nb layers and a compressive strain in Zr layers, while the thicker multilayer showed a compressive strain in both layers. The strain is higher in the thin multilayer and increases for higher fluences. We developed a mathematical method for the fundamental understanding of the deformation mechanisms in metallic multilayers subjected to radiation damage. In the model, the cumulative strain within a layer is described as the combination of two contributions coming from the interfacial region and the inner region of the layers. The semi-analytical model predicts that the interfacial strain is dominant and extends over a certain region around the interface. Predictions are well supported by ab-initio calculations which show that in the vicinity of the interface and in the Zr side, vacancies and interstitials (low energy barriers) exhibit high mobility compared to the Nb side, thus resulting in a high recombination rate. As a consequence, less strain occurs in the Zr side of the interface compared to the Nb side. The density and distribution of various types of defects along the ion profile (low and high damaged regions) are obtained by combining DFT results and the predictions of the model. (c) 2020 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Keywords

Multilayers; Ion implantation; XRD; TEM; strain; DFT

Authors

DAGHBOUJ, N.; CALLISTI, M.; SEN, H. S.; KARLIK, M.; ČECH, J.; VRONKA, M.; HAVRÁNEK, V.; ČAPEK, J.; MINÁRIK, P.; BÁBOR, P.; POLCAR, T.

Released

1. 1. 2021

Publisher

PERGAMON-ELSEVIER SCIENCE LTD

Location

OXFORD

ISBN

1359-6454

Periodical

Acta materialia

Year of study

202

Number

1

State

United States of America

Pages from

317

Pages to

330

Pages count

14

URL

https://doi.org/10.1016/j.actamat.2020.10.072

BibTex

@article{BUT168100,
  author="DAGHBOUJ, N. and CALLISTI, M. and SEN, H. S. and KARLIK, M. and ČECH, J. and VRONKA, M. and HAVRÁNEK, V. and ČAPEK, J. and MINÁRIK, P. and BÁBOR, P. and POLCAR, T.",
  title="Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers",
  journal="Acta materialia",
  year="2021",
  volume="202",
  number="1",
  pages="317--330",
  doi="10.1016/j.actamat.2020.10.072",
  issn="1359-6454",
  url="https://doi.org/10.1016/j.actamat.2020.10.072"
}