Publication detail

Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study

PÁNEK, R. LOJDA, J. PODIVÍNSKÝ, J. KOTÁSEK, Z.

Original Title

Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study

Type

conference paper

Language

English

Original Abstract

This paper deals with a reliability analysis of a reconfiguration controller which can be a component of a fault-tolerant control system. This controller is designed for an FPGA to be capable of using partial dynamic reconfiguration of the FPGA to mitigate potential faults in the FPGAs configuration memory. These faults, which are called SEUs, can be induced by radiation effects. Therefore, fault tolerance measurement or estimation is very important for designing circuits for critical environments. Thus, the reliability of the reconfiguration controller itself is significant; therefore the Fault Tolerance ESTimation (FT-EST) framework is used for reliability evaluation, which is procured by the discovery of a number of critical configuration bits. Two approaches are used and compared: evaluations of used LUT only, and evaluations of all configuration bits. We ascertained a 20x reduction in time consumption at the expense of a proportional decrease in the amount of critical configuration bits discovered. The obtained results are nearly equivalent.

Keywords

Fault-Tolerant, Partial Dynamic Reconfiguration Controller, Fault Tolerance Property Estimation, FT-EST

Authors

PÁNEK, R.; LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z.

Released

14. 8. 2020

Publisher

IEEE Computer Society

Location

Hsinchu

ISBN

978-1-7281-6083-2

Book

2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers

Pages from

121

Pages to

124

Pages count

4

URL

BibTex

@inproceedings{BUT168116,
  author="Richard {Pánek} and Jakub {Lojda} and Jakub {Podivínský} and Zdeněk {Kotásek}",
  title="Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study",
  booktitle="2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers",
  year="2020",
  pages="121--124",
  publisher="IEEE Computer Society",
  address="Hsinchu",
  doi="10.1109/VLSI-DAT49148.2020.9196269",
  isbn="978-1-7281-6083-2",
  url="https://www.fit.vut.cz/research/publication/12101/"
}