Publication detail

Random Test Generation Through a Probabilistic Constrained Grammar

ČEKAN, O. KOTÁSEK, Z.

Original Title

Random Test Generation Through a Probabilistic Constrained Grammar

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The paper introduces a probabilistic constrained grammar which is a newly formed grammar system for the use in the area of test stimuli generation. The grammar extends the existing probabilistic context-free grammar and establishes constraints for the grammar limitations. Stimuli obtained through the proposed principle are used in functional verification of a RISC processor and the coverage metric is evaluated. The paper also contains examples of how to define a problem of assembly code generation for processors.

Authors

ČEKAN, O.; KOTÁSEK, Z.

Released

25. 4. 2018

Location

Budapešť

Pages from

5

Pages to

8

Pages count

4

BibTex

@inproceedings{BUT168460,
  author="Ondřej {Čekan} and Zdeněk {Kotásek}",
  title="Random Test Generation Through a Probabilistic Constrained Grammar",
  booktitle="INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
  year="2018",
  pages="5--8",
  address="Budapešť"
}