Publication detail

BUT- PT System Description for NIST LRE 2017

MATĚJKA, P. PLCHOT, O. NOVOTNÝ, O. CUMANI, S. LOZANO DÍEZ, A. SLAVÍČEK, J. DIEZ SÁNCHEZ, M. GRÉZL, F. GLEMBEK, O. KAMSALI VEERA, M. SILNOVA, A. BURGET, L. ONDEL YANG, L. KESIRAJU, S. ROHDIN, J.

Original Title

BUT- PT System Description for NIST LRE 2017

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

This article is about the BUT - PT System Description for the NIST LRE 2017 evaluation. We have built over 30 systems for this evaluation with the main focus to build a single best system. We experimented with denoising NN, automatic discovery units, different flavors of phonotactic systems, different backends, different sizes of i-vector systems, different BN features, NN embeddings and frame level language classifiers.The evaluation plan stated "Teams are encouraged to reportwhether and how having access to the development set helpedimprove the performance". The development data helped mainlyin the final classifier and also helped in the decision processwhich techniques to use and which to fuse because our test setconsisted of this data.

Keywords

speech recognition, language recognition

Authors

MATĚJKA, P.; PLCHOT, O.; NOVOTNÝ, O.; CUMANI, S.; LOZANO DÍEZ, A.; SLAVÍČEK, J.; DIEZ SÁNCHEZ, M.; GRÉZL, F.; GLEMBEK, O.; KAMSALI VEERA, M.; SILNOVA, A.; BURGET, L.; ONDEL YANG, L.; KESIRAJU, S.; ROHDIN, J.

Released

12. 12. 2017

Publisher

National Institute of Standards and Technology

Location

Orlando, Florida

Pages from

1

Pages to

6

Pages count

6

URL

https://www.fit.vut.cz/research/publication/11655/

BibTex

@inproceedings{BUT168463,
  author="MATĚJKA, P. and PLCHOT, O. and NOVOTNÝ, O. and CUMANI, S. and LOZANO DÍEZ, A. and SLAVÍČEK, J. and DIEZ SÁNCHEZ, M. and GRÉZL, F. and GLEMBEK, O. and KAMSALI VEERA, M. and SILNOVA, A. and BURGET, L. and ONDEL YANG, L. and KESIRAJU, S. and ROHDIN, J.",
  title="BUT- PT System Description for NIST LRE 2017",
  booktitle="Proceedings of NIST Language Recognition Workshop 2017",
  year="2017",
  pages="1--6",
  publisher="National Institute of Standards and Technology",
  address="Orlando, Florida",
  url="https://www.fit.vut.cz/research/publication/11655/"
}

Documents

matejka_lre17-system-description.pdf