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BIOLEK, D. KOLKA, Z. BIOLKOVÁ, V. BIOLEK, Z. KVATINSKY, S.
Original Title
(V)TEAM for SPICE Simulation of Memristive Devices With Improved Numerical Performance
Type
journal article in Web of Science
Language
English
Original Abstract
The paper introduces a set of models of memristive devices for a reliable, accurate and fast analysis of large networks in the SPICE (Simulation Program with Integrated Circuit Emphasis) environment. The modeling starts from the recently introduced TEAM (ThrEshold Adaptive Memristor Model) and VTEAM (Voltage ThrEshold Adaptive Memristor Model). A number of improvements are made towards the stick effect elimination and other numerical renements to make the analysis of large networks fast and accurate. A set of models are proposed that utilize the synergy of several techniques such as window asymmetrization, integration with saturation, state equation preprocessing, scaling, and smoothing. The performance of models is tested in Cadence PSPICE 17.2 and particularly in HSPICE v2017, the latter on a large-scale CNN (Cellular Nonlinear Network) for detecting edges of binary images. The simulations manifest the usability of developed models for fast and reliable operation in networks containing more than one million nodes.
Keywords
Memristor; VTEAM; window function; stick effect; SPICE; cellular nonlinear network
Authors
BIOLEK, D.; KOLKA, Z.; BIOLKOVÁ, V.; BIOLEK, Z.; KVATINSKY, S.
Released
25. 2. 2021
Publisher
IEEE
Location
USA
ISBN
2169-3536
Periodical
IEEE Access
Year of study
9
Number
2
State
United States of America
Pages from
30242
Pages to
30255
Pages count
14
URL
https://ieeexplore.ieee.org/document/9354151
Full text in the Digital Library
http://hdl.handle.net/11012/196418
BibTex
@article{BUT170268, author="Dalibor {Biolek} and Zdeněk {Kolka} and Viera {Biolková} and Zdeněk {Biolek} and Shahar {Kvatinsky}", title="(V)TEAM for SPICE Simulation of Memristive Devices With Improved Numerical Performance", journal="IEEE Access", year="2021", volume="9", number="2", pages="30242--30255", doi="10.1109/ACCESS.2021.3059241", issn="2169-3536", url="https://ieeexplore.ieee.org/document/9354151" }