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BRAMERDORFER, G. MARTH, E. SILBER, S. BÁRTA, J. LOLOVÁ, I. KNEBL, L.
Original Title
Multi-Objective Topology Optimization of Synchronous Reluctance Machines Considering Design for Manufacturability Aspects
Type
conference paper
Language
English
Original Abstract
This work is about optimizing synchronous reluctance machines considering a topology optimization (TO) based approach. This technique gives more design flexibility when comparing with finding ideal parameters for predefined geometries. A consistent implementation is presented that significantly reduces the overall computational effort compared to classical TO. In addition, attention is paid to obtaining designs ready for manufacturing. By contrast to the majority of previous work, the analysis encompasses multiple often conflicting objectives relevant for manufacturers and consequent customers, i.e., efficiency, maximum torque, torque ripple, and power factor. Based on the derived results, an individual tradeoff can be found and new insights into optimal designs for various applications can be gained.
Keywords
design for manufacturability, evolutionary algorithms, manufacturing impact, material degradation, synchronous reluctance machine, topology optimization
Authors
BRAMERDORFER, G.; MARTH, E.; SILBER, S.; BÁRTA, J.; LOLOVÁ, I.; KNEBL, L.
Released
21. 6. 2021
Publisher
IEEE
ISBN
978-1-7281-3123-8
Book
2020 IEEE 19th Biennial Conference on Electromagnetic Field Computation (CEFC)
Pages from
1
Pages to
4
Pages count
URL
https://ieeexplore.ieee.org/document/9451408
BibTex
@inproceedings{BUT172203, author="Gerd {Bramerdorfer} and Edmund {Marth} and Siegfried {Silber} and Jan {Bárta} and Iveta {Lolová} and Ladislav {Knebl}", title="Multi-Objective Topology Optimization of Synchronous Reluctance Machines Considering Design for Manufacturability Aspects", booktitle="2020 IEEE 19th Biennial Conference on Electromagnetic Field Computation (CEFC)", year="2021", pages="1--4", publisher="IEEE", doi="10.1109/CEFC46938.2020.9451408", isbn="978-1-7281-3123-8", url="https://ieeexplore.ieee.org/document/9451408" }