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MAHATA, S. HERENCSÁR, N. ALAGOZ, B. B. YEROGLU, C.
Original Title
A Robust Frequency-Domain-Based Order Reduction Scheme for Linear Time-Invariant Systems
Type
journal article in Web of Science
Language
English
Original Abstract
This paper presents a robust model order reduction technique with guaranteed stability, minimum phase, and matched steady-state response for linear time-invariant single-input-single-output systems. The proposed approach is generalized, allowing the designer to select any desired order of the reduced-order model (ROM). In contrast to the published literature, which primarily uses the time-domain behavior, the proposed technique utilizes the frequency-domain information of the full-order system. The suggested strategy allows the determination of the optimal ROM in a single step, simpler than the various recently reported mixed methods. The robustness is demonstrated using convergence studies and statistical measures about the final solution quality and model coefficients. The superiority over the recent literature is illustrated through four numerical examples using various time-domain and frequency response performance metrics.
Keywords
Frequency response, linear time-invariant system, model order reduction, reduced-order modelling, single-input-single-output system
Authors
MAHATA, S.; HERENCSÁR, N.; ALAGOZ, B. B.; YEROGLU, C.
Released
23. 12. 2021
Publisher
IEEE
ISBN
2169-3536
Periodical
IEEE Access
Year of study
9
Number
1
State
United States of America
Pages from
165773
Pages to
165785
Pages count
13
URL
https://ieeexplore.ieee.org/document/9648306
Full text in the Digital Library
http://hdl.handle.net/11012/203260
BibTex
@article{BUT175279, author="Shibendu {Mahata} and Norbert {Herencsár} and Baris Baykant {Alagoz} and Celaleddin {Yeroglu}", title="A Robust Frequency-Domain-Based Order Reduction Scheme for Linear Time-Invariant Systems", journal="IEEE Access", year="2021", volume="9", number="1", pages="165773--165785", doi="10.1109/ACCESS.2021.3135279", issn="2169-3536", url="https://ieeexplore.ieee.org/document/9648306" }