Publication detail

Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond

ŠTUBIAN, M. BOBEK, J. SETVÍN, M. DIEBOLD, U. SCHMID, M.

Original Title

Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond

Type

journal article in Web of Science

Language

English

Original Abstract

A transimpedance amplifier has been designed for scanning tunneling microscopy (STM). The amplifier features low noise (limited by the Johnson noise of the 1 G Omega feedback resistor at low input current and low frequencies), sufficient bandwidth for most STM applications (50 kHz at 35 pF input capacitance), a large dynamic range (0.1 pA-50 nA without range switching), and a low input voltage offset. The amplifier is also suited for placing its first stage into the cryostat of a low-temperature STM, minimizing the input capacitance and reducing the Johnson noise of the feedback resistor. The amplifier may also find applications for specimen current imaging and electron-beam-induced current measurements in scanning electron microscopy and as a photodiode amplifier with a large dynamic range. This paper also discusses the sources of noise including the often neglected effect of non-balanced input impedance of operational amplifiers and describes how to accurately measure and adjust the frequency response of low-current transimpedance amplifiers.

Keywords

THERMAL NOISE; SINGLE ATOMS; GATE NOISE; BANDWIDTH; PREAMPLIFIER; SURFACE

Authors

ŠTUBIAN, M.; BOBEK, J.; SETVÍN, M.; DIEBOLD, U.; SCHMID, M.

Released

1. 7. 2020

Publisher

AMER INST PHYSICS

Location

MELVILLE

ISBN

0034-6748

Periodical

Review of Scientific Instruments

Year of study

91

Number

7

State

United States of America

Pages from

1

Pages to

11

Pages count

11

URL

https://aip.scitation.org/doi/10.1063/5.0011097

BibTex

@article{BUT177312,
  author="Martin {Štubian} and Juraj {Bobek} and Martin {Setvín} and Ulrike {Diebold} and Michael {Schmid}",
  title="Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond",
  journal="Review of Scientific Instruments",
  year="2020",
  volume="91",
  number="7",
  pages="1--11",
  doi="10.1063/5.0011097",
  issn="0034-6748",
  url="https://aip.scitation.org/doi/10.1063/5.0011097"
}