Publication detail

An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference

KROLÁK, D. HORSKÝ, P.

Original Title

An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference

Type

journal article in Web of Science

Language

English

Original Abstract

This article presents a new electromagnetic compatibility improved bandgap voltage reference with a low-current consumption of only 3.2 μA. The reference is designed for automotive applications with an extended temperature range from −50 to 200 °C and a low electromagnetic interference (EMI) susceptibility. The designed reference comes from the well-known Brokaw bandgap topology utilizing only five bipolar junction transistors in a reference core with a collector current leakage compensation. We propose several novel EMI susceptibility improvements of the reference core with a new asymmetrical operational amplifier. Every improvement is discussed in detail and general recommendations, on how to decrease the bandgap EMI susceptibility, are presented. Simulation results are compared with measurements on a system on chip. Measurement results show dc voltage variation below 0.5% for 5 mW (7 dBm) supply EMI over the frequency range from 100 kHz to 1 GHz.

Keywords

Bandgap voltage reference, Brokaw bandgap voltage reference, bandgap reference, electromagnetic compatibility, electromagnetic interference, integrated circuit, voltage reference

Authors

KROLÁK, D.; HORSKÝ, P.

Released

16. 4. 2024

Publisher

IEEE

Location

Piscataway, USA

ISBN

1558-187X

Periodical

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY

Year of study

1

Number

1

State

United States of America

Pages from

1

Pages to

8

Pages count

8

URL

https://ieeexplore.ieee.org/document/10502225

BibTex

@article{BUT177757,
  author="David {Krolák} and Pavel {Horský}",
  title="An EMI Susceptibility Improved, Wide Temperature Range Bandgap Voltage Reference",
  journal="IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY",
  year="2024",
  volume="1",
  number="1",
  pages="1--8",
  doi="10.1109/TEMC.2024.3381816",
  issn="1558-187X",
  url="https://ieeexplore.ieee.org/document/10502225"
}