Přístupnostní navigace
E-application
Search Search Close
Publication detail
LAZAR, J. HOLÁ, M. HRABINA, J. BUCHTA, Z. ČÍP, O. OULEHLA, J.
Original Title
Displacement measurement with over-determined interferometer
Type
conference paper
Language
English
Original Abstract
We present a concept combining traditional displacement incremental interferometry with a tracking refractometer following the fluctuations of the refractive index of air. This concept is represented by an interferometric system of three Michelson-type interferometers where two are arranged in a counter-measuring configuration and the third one is set to measure the changes of the fixed length, here the measuring range of the overall displacement. In this configuration the two counter-measuring interferometers have identical beam paths with proportional parts of the overall one. The fixed interferometer with its geometrical length of the measuring beam linked to a mechanical reference made of a high thermal-stability material (Zerodur) operates as a tracking refractometer monitoring the atmospheric refractive index directly in the beam path of the displacement measuring interferometers. This principle has been demonstrated experimentally through a set of measurements in a temperature controlled environment under slowly changing refractive index of air in comparison with its indirect measurement through Edlen formula. With locking of the laser optical frequency to fixed value of the overall optical length the concept can operate as an interferometric system with compensation of the fluctuations of the refractive index of air
Keywords
iterferometry, refractometry, metrology
Authors
LAZAR, J.; HOLÁ, M.; HRABINA, J.; BUCHTA, Z.; ČÍP, O.; OULEHLA, J.
Released
7. 9. 2012
ISBN
978-0-8194-9481-8
Book
Proceedings of SPIE
BibTex
@inproceedings{BUT177924, author="Josef {Lazar} and Miroslava {Holá} and Jan {Hrabina} and Zdeněk {Buchta} and Ondřej {Číp} and Jindřich {Oulehla}", title="Displacement measurement with over-determined interferometer ", booktitle="Proceedings of SPIE", year="2012", isbn="978-0-8194-9481-8" }