Publication detail

Terahertz electron paramagnetic resonance generalized spectroscopic ellipsometry: The magnetic response of the nitrogen defect in 4H-SiC

SCHUBERT, M. KNIGHT, S. RICHTER, S. KUEHNE, P. STANISHEV, V. RUDER, A. STOKEY, M. KORLACKI, R. IRMSCHER, K. NEUGEBAUER, P. DARAKCHIEVA, V.

Original Title

Terahertz electron paramagnetic resonance generalized spectroscopic ellipsometry: The magnetic response of the nitrogen defect in 4H-SiC

Type

journal article in Web of Science

Language

English

Original Abstract

We report on terahertz (THz) electron paramagnetic resonance generalized spectroscopic ellipsometry (THz-EPR-GSE). Measurements of field and frequency dependencies of magnetic response due to spin transitions associated with nitrogen defects in 4H-SiC are shown as an example. THz-EPR-GSE dispenses with the need of a cavity, permits independently scanning field and frequency parameters, and does not require field or frequency modulation. We investigate spin transitions of hexagonal (h) and cubic (k) coordinated nitrogen including coupling with its nuclear spin (I = 1), and we propose a model approach for the magnetic susceptibility to account for the spin transitions. From the THz-EPR-GSE measurements, we can fully determine polarization properties of the spin transitions, and we can obtain the k coordinated nitrogen g and hyperfine splitting parameters using magnetic field and frequency dependent Lorentzian oscillator line shape functions. Magnetic-field line broadening presently obscures access to h parameters. We show that measurements of THz-EPR-GSE at positive and negative fields differ fundamentally and hence provide additional information. We propose frequency-scanning THz-EPR-GSE as a versatile method to study properties of spins in solid state materials.

Keywords

MAGNETOOPTIC ELLIPSOMETRY; FREQUENCY; EPR; PARAMETERS; ANISOTROPY; SPECTRA; ENDOR

Authors

SCHUBERT, M.; KNIGHT, S.; RICHTER, S.; KUEHNE, P.; STANISHEV, V.; RUDER, A.; STOKEY, M.; KORLACKI, R.; IRMSCHER, K.; NEUGEBAUER, P.; DARAKCHIEVA, V.

Released

8. 3. 2022

Publisher

AIP Publishing

Location

MELVILLE

ISBN

0003-6951

Periodical

Applied Physics Letters

Year of study

120

Number

10

State

United States of America

Pages from

1

Pages to

6

Pages count

6

URL

https://aip.scitation.org/doi/10.1063/5.0082353

Full text in the Digital Library

http://hdl.handle.net/11012/209154

BibTex

@article{BUT178581,
  author="Mathias {Schubert} and Sean {Knight} and Steffen {Richter} and Philipp {Kuehne} and Vallery {Stanishev} and Alexander {Ruder} and Megan {Stokey} and Rafal {Korlacki} and Klaus {Irmscher} and Petr {Neugebauer} and Vanya {Darakchieva}",
  title="Terahertz electron paramagnetic resonance generalized spectroscopic ellipsometry: The magnetic response of the nitrogen defect in 4H-SiC",
  journal="Applied Physics Letters",
  year="2022",
  volume="120",
  number="10",
  pages="1--6",
  doi="10.1063/5.0082353",
  issn="0003-6951",
  url="https://aip.scitation.org/doi/10.1063/5.0082353"
}