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ZEMEK, M. ŠALPLACHTA, J. ZIKMUND, T. OMOTE, K. TAKEDA, Y. OBERTA, P. KAISER, J.
Original Title
Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography
Type
journal article - other
Language
English
Original Abstract
Misalignment of the rotation axis causes severe artifacts in X-ray computed tomography. Calibration of this parameter is often insufficient for sub-micron resolution measurements and needs to be corrected during the post-processing. This correction can be accelerated by various automatic methods. These vary in mechanisms and performance, making them suitable for different use-cases. This work summarizes existing automatic methods for estimating the rotation axis in X-ray computed tomography, with a focus on sub-micron applications. Some of the methods are implemented and compared in the context of a laboratory sub-micron scanner to demonstrate practical considerations of this task.
Keywords
Computed tomography;Rotation Axis;Tuning-fork artifact;Automatic
Authors
ZEMEK, M.; ŠALPLACHTA, J.; ZIKMUND, T.; OMOTE, K.; TAKEDA, Y.; OBERTA, P.; KAISER, J.
Released
1. 3. 2023
Publisher
Elsevier
ISBN
2949-673X
Periodical
Tomography of Materials and Structures
Year of study
1
Number
March 2023
State
Kingdom of the Netherlands
Pages from
Pages to
17
Pages count
URL
https://www.sciencedirect.com/science/article/pii/S2949673X2200002X
Full text in the Digital Library
http://hdl.handle.net/11012/244321
BibTex
@article{BUT180531, author="Marek {Zemek} and Jakub {Šalplachta} and Tomáš {Zikmund} and Kazuhiko {Omote} and Yoshihiro {Takeda} and Peter {Oberta} and Jozef {Kaiser}", title="Automatic marker-free estimation methods for the axis of rotation in sub-micron X-ray computed tomography", journal="Tomography of Materials and Structures", year="2023", volume="1", number="March 2023", pages="1--17", doi="10.1016/j.tmater.2022.100002", issn="2949-673X", url="https://www.sciencedirect.com/science/article/pii/S2949673X2200002X" }