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JAIN, M. ALIJANI, M. WILTSHIRE, B. MACÁK, J. ZARIFI, M.
Original Title
High Resolution Ultra-Violet Radiation Detection Using TNT-integrated Wireless Passive Microwave Resonator
Type
conference paper
Language
English
Original Abstract
This work presents high-resolution detection and quantification of ultraviolet (UV) radiation using a passive splitring resonator (SRR) tag integrated with TiO2 nanotube (TNT) membrane. The passive tag was electromagnetically coupled to an active feedback-assisted SRR reader, which compensated the dielectric and radiation losses of the coupled resonant sensor and increased the quality factor (Q) from 87 (passive) to 700 (active). The proposed sensor operated at the frequency span of 2.5 GHz to 3.2 GHz, where the passive tag was placed 3 cm above the SRR reader. UV exposure of TNT changed the dielectric properties (permittivity and conductivity) of the membrane and consequently was reflected as variation in the resonant amplitude and frequency of the sensor. Measured results demonstrated five times higher sensitivity for active sensor (0.22 dB/Wcm(-2)) compared to the passive counterpart (0.04 dB/Wcm(-2)). Due to improved sensitivity, this robust microwave-based UV sensor is suitable for various industrial and biomedical applications.
Keywords
active-feedback circuit; passive tag; split-ring resonator; TiO2 nanotube membrane; UV sensing
Authors
JAIN, M.; ALIJANI, M.; WILTSHIRE, B.; MACÁK, J.; ZARIFI, M.
Released
19. 6. 2022
Publisher
IEEE
Location
NEW YORK
ISBN
978-1-6654-9613-1
Book
IEEE MTT-S International Microwave Symposium
Pages from
133
Pages to
136
Pages count
4
URL
https://ieeexplore.ieee.org/document/9865511
BibTex
@inproceedings{BUT182322, author="Mandeep Chhajer {Jain} and Mahnaz {Alijani} and Benjamin D. {Wiltshire} and Jan {Macák} and Mohammad H. {Zarifi}", title="High Resolution Ultra-Violet Radiation Detection Using TNT-integrated Wireless Passive Microwave Resonator", booktitle="IEEE MTT-S International Microwave Symposium", year="2022", pages="133--136", publisher="IEEE", address="NEW YORK", doi="10.1109/IMS37962.2022.9865511", isbn="978-1-6654-9613-1", url="https://ieeexplore.ieee.org/document/9865511" }