Publication result detail

Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films

MISIUREV, D.; HOLCMAN, V;

Original Title

Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films

English Title

Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films

Type

Paper in proceedings outside WoS and Scopus

Original Abstract

The paper will provide a brief overview of one of the most popular multiferroic material bismuth ferrite, which was under intense study over the past decades. The reasons why the material earned such a great popularity in recent years will be described in detail. Piezoresponse Force Microscopy (PFM) would be used in order to investigate ferroelectric and magnetic properties of the material. In addition to ferroelectric and magnetic properties, the PFM method reveals the presence of piezo–active regions with different orientation based on their colorations. Samples of 100 nm BiFeO3 material were deposited by using pulsed laser deposition technique on multiplayer substrates Pt/Ti(TiO2)/Si will undergo investigation by PFM. The investigation of produced samples is necessary to determine the topology of produce samples in terms of surface roughness across the investigated surface and potential effect of topology of deposited samples on layout of domains.

English abstract

The paper will provide a brief overview of one of the most popular multiferroic material bismuth ferrite, which was under intense study over the past decades. The reasons why the material earned such a great popularity in recent years will be described in detail. Piezoresponse Force Microscopy (PFM) would be used in order to investigate ferroelectric and magnetic properties of the material. In addition to ferroelectric and magnetic properties, the PFM method reveals the presence of piezo–active regions with different orientation based on their colorations. Samples of 100 nm BiFeO3 material were deposited by using pulsed laser deposition technique on multiplayer substrates Pt/Ti(TiO2)/Si will undergo investigation by PFM. The investigation of produced samples is necessary to determine the topology of produce samples in terms of surface roughness across the investigated surface and potential effect of topology of deposited samples on layout of domains.

Keywords

Nanomaterials, multiferroics, ferroelectrics, bismuth ferrite, piezoresponce, polarization.

Key words in English

Nanomaterials, multiferroics, ferroelectrics, bismuth ferrite, piezoresponce, polarization.

Authors

MISIUREV, D.; HOLCMAN, V;

Released

01.07.2023

Pages from

410

Pages to

414

Pages count

5

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf

BibTex

@inproceedings{BUT183667,
  author="Denis {Misiurev} and Vladimír {Holcman}",
  title="Direct Piezoelectric response miscroscopy of Bismuth ferrite thin films",
  year="2023",
  pages="410--414",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf"
}