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VAŠÍČEK, Z. MRÁZEK, V. SEKANINA, L.
Original Title
Automated Verifiability-Driven Design of Approximate Circuits: Exploiting Error Analysis
Type
conference paper
Language
English
Original Abstract
A fundamental assumption for search-based circuit approximation methods is the ability to massively and efficiently traverse the search space and evaluate candidate solutions. For complex approximate circuits (adders and multipliers), common error metrics, and error analysis approaches (SAT solving, BDD analysis), we perform a detailed analysis to understand the behavior of the error analysis methods under constrained resources, such as limited execution time. In addition, we show that when evaluating the error of a candidate approximate circuit, it is highly beneficial to reuse knowledge obtained during the evaluation of previous circuit instances to reduce the total design time. When an adaptive search strategy that drives the search towards promptly verifiable approximate circuits is employed, the method can discover circuits that exhibit better trade-offs between error and desired parameters (such as area) than the same method with unconstrained verification resources and within the same overall time budget. For 16-bit and 20-bit approximate multipliers, it was possible to achieve a 75% reduction in area when compared with the baseline method.
Keywords
approximate computing, approximate arithmetic circuit, formal analysis, constrained verification
Authors
VAŠÍČEK, Z.; MRÁZEK, V.; SEKANINA, L.
Released
15. 5. 2024
Publisher
Institute of Electrical and Electronics Engineers
Location
Valencia
ISBN
979-8-3503-4859-0
Book
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Pages from
1
Pages to
6
Pages count
BibTex
@inproceedings{BUT188464, author="Zdeněk {Vašíček} and Vojtěch {Mrázek} and Lukáš {Sekanina}", title="Automated Verifiability-Driven Design of Approximate Circuits: Exploiting Error Analysis", booktitle="2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)", year="2024", pages="1--6", publisher="Institute of Electrical and Electronics Engineers", address="Valencia", isbn="979-8-3503-4859-0" }