Publication detail

27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

DENIZIAK, S. SITEK, P. JENIHHIN, M. STEININGER, A. SCHÖLZEL, M. MRÁZEK, V.

Original Title

27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Type

conference proceedings

Language

English

Original Abstract

This proceedings contains reviewed papers accepted for publication and presentation at the 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2024). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.

Keywords

electronic circuit, design, test, design method, digital circuit, analog circuit

Authors

DENIZIAK, S.; SITEK, P.; JENIHHIN, M.; STEININGER, A.; SCHÖLZEL, M.; MRÁZEK, V.

Released

14. 5. 2024

Publisher

Institute of Electrical and Electronics Engineers

Location

Kliece

ISBN

979-8-3503-5934-3

Pages count

155

URL

https://ieeexplore.ieee.org/servlet/opac?punumber=10508803

BibTex

@proceedings{BUT188622,
  editor="DENIZIAK, S. and SITEK, P. and JENIHHIN, M. and STEININGER, A. and SCHÖLZEL, M. and MRÁZEK, V.",
  title="27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2024",
  pages="155",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Kliece",
  doi="10.1109/DDECS60919.2024",
  isbn="979-8-3503-5934-3",
  url="https://ieeexplore.ieee.org/servlet/opac?punumber=10508803"
}