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KLVAČ, O. KAZDA, T. TROCHTA, D.
Original Title
Preparation of Battery Samples for Scanning Electron Microscope Analysis
English Title
Type
article in a collection out of WoS and Scopus
Language
Czech
Original Abstract
This conference paper describes methods of preparing battery samples using the Broad Ion beam polishing (BIB) technique. Firstly, a battery is described as a system of individual layers and interfaces, for which the scanning electron microscopy (SEM) method, although suitable, will not provide sufficient information without proper sample preparation. One possibility is to create cross-sections using BIB technique. This paper describes the specifics of BIB method applied for battery samples.
English abstract
Keywords
SEM; BIB; in-situ; ex-situ; Li-ion
Key words in English
Authors
KLVAČ, O.; KAZDA, T.; TROCHTA, D.
Released
26. 6. 2024
Publisher
Česká elektrotechnická společnost, ÚOS chemické zdroje
Location
hotel Savannah - Hatě 198
ISBN
978-80-02-03054-6
Book
45. Nekonvenční zdroje elektrické energie
Edition number
1
Pages from
30
Pages to
32
Pages count
3
URL
https://www.nzee.cz/
BibTex
@inproceedings{BUT189017, author="Ondřej {Klvač} and Tomáš {Kazda} and David {Trochta}", title="Preparation of Battery Samples for Scanning Electron Microscope Analysis", booktitle="45. Nekonvenční zdroje elektrické energie", year="2024", number="1", pages="30--32", publisher="Česká elektrotechnická společnost, ÚOS chemické zdroje", address="hotel Savannah - Hatě 198", isbn="978-80-02-03054-6", url="https://www.nzee.cz/" }