Publication detail

Testbed for Simulation of MCU Application using RISC-V soft-core

OHNÚT, P. ARM, J.

Original Title

Testbed for Simulation of MCU Application using RISC-V soft-core

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The MCU software testing based on RTOS (Real-Time Operating System) is an extensive area in research and practical domain. The work presents an approach to testing firmware using RISC-V soft-core in the FPGA environment. The testing process embodies a designed test-bench that can operate automatically using a script. The testing procedure rests in the execution of a tested program with a pre-defined input set of signals. The procedure output is stored in a structured file. Such a testing scenario represents the program behavior in a specific situation; using the automated way, more scenario outputs could be obtained. The preliminary results suggest the output files of a program could be analyzed to determine if the tested program comprises an error.

Keywords

Testing, MCU, RTOS, soft-core, FPGA, RISC-V

Authors

OHNÚT, P.; ARM, J.

Released

25. 4. 2023

Publisher

Brno University of Technology, Faculty of Electrical Engineering and Communication

Location

Brno, Česká republika

ISBN

978-80-214-6153-6

Book

Proceedings I of the 29th Conference STUDENT EEICT 2023

Edition number

1

Pages from

131

Pages to

134

Pages count

4

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf

BibTex

@inproceedings{BUT189211,
  author="Petr {Ohnút} and Jakub {Arm}",
  title="Testbed for Simulation of MCU Application using RISC-V soft-core",
  booktitle="Proceedings I of the 29th Conference STUDENT EEICT 2023",
  year="2023",
  number="1",
  pages="131--134",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and Communication",
  address="Brno, Česká republika",
  isbn="978-80-214-6153-6",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2023_sbornik_1.pdf"
}