Product detail

SEMPA calibration sample with in-plane magnetization

STAŇO, M. FLAJŠMAN, L. UHLÍŘ, V.

Product type

funkční vzorek

Abstract

Reference (calibration) sample for Scanning Electron Microscopy with Polarization Analysis (SEMPA/spin-SEM). UHV compatible. Sample contains patterned Fe micro and nanostructures with well-defined magnetic domains. The selected material (Fe, iron) has a high spin-polarization and provides high magnetic signal.

Keywords

SEMPA, spin-SEM, magnetic imaging, in-plane magnetization, reference sample, nanotechnology, ion patterning, FIB, magnetic vortex

Create date

15. 12. 2023

Location

CEITEC BUT, Brno University of Technology Purkyňova 656/123, 61200 Brno, Czech Republic

Possibilities of use

Výsledek je využíván vlastníkem

Licence fee

Poskytovatel licence na výsledek požaduje licenční poplatek

www

https://magnetism.ceitec.cz/text/detail/167