Publication detail
Anomaly Detection in Industrial Networks: Current State, Classification, and Key Challenges
KUCHAŘ, K. FUJDIAK, R.
Original Title
Anomaly Detection in Industrial Networks: Current State, Classification, and Key Challenges
Type
journal article in Web of Science
Language
English
Original Abstract
Industrial networks, due to communication convergence, face a growing exposure to cyber threats, necessitating the need to address a wider range of threats, alongside their detectability and classification. As critical components designed with a strong emphasis on availability, industrial networks require precise classification of anomalies, encompassing not just cyber anomalies but also operational and service disruptions. This paper provides an analysis of these anomalies, categorizing them into three groups based on their impact. The key contribution of this study lies in the strategic distribution of data sources across the Operational Technology (OT) network, facilitating the collection of relevant data for application in Machine Learning (ML) or Neural Network (NN) models. A comprehensive review of current anomaly processing techniques in industrial networks is presented, identifying significant research challenges to advance artificial intelligence methods for anomaly classification in OT environments. Additionally, this work examines common statistical methods for anomaly detection and offers a comparative analysis of prevalent ML and NN techniques.
Keywords
Anomaly types; sensory data; cyber-security; industrial control system (ICS); operational technology (OT); Neural Network (NN)
Authors
KUCHAŘ, K.; FUJDIAK, R.
Released
12. 12. 2024
Publisher
Institute of Electrical and Electronics Engineers Inc.
ISBN
1558-1748
Periodical
IEEE SENSORS JOURNAL
Year of study
25
Number
3
State
United States of America
Pages from
1
Pages to
14
Pages count
14
URL
BibTex
@article{BUT193646,
author="Karel {Kuchař} and Radek {Fujdiak}",
title="Anomaly Detection in Industrial Networks: Current State, Classification, and Key Challenges",
journal="IEEE SENSORS JOURNAL",
year="2024",
volume="25",
number="3",
pages="1--14",
doi="10.1109/JSEN.2024.3512857",
issn="1558-1748",
url="https://ieeexplore.ieee.org/document/10797650"
}