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Publication detail
Raška Michal, Koktavý Pavel
Original Title
Šum mikroplazmy v PN přechodu a její vliv na tvar VA charakteristiky
English Title
Microplasma noise in PN junction and its influence on course of a VA characteristic
Type
conference paper
Language
Czech
Original Abstract
The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions. The existence of such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns are represented by two level current impuls noise and affect course of VA characteristics. VA characteristics can exhibit regions with negative differential resistance in certain conditions.
Key words in English
Microplasma, noise, PN junction, VA characteristic, breakdown, avalanche
Authors
RIV year
2006
Released
30. 10. 2006
Publisher
Západočeská universita v Plzni
ISBN
80-7043-473-2
Book
elektrotechnika a informatika 2006
Edition number
1
Pages from
85
Pages to
88
Pages count
4
BibTex
@inproceedings{BUT20224, author="Michal {Raška} and Pavel {Koktavý}", title="Šum mikroplazmy v PN přechodu a její vliv na tvar VA charakteristiky", booktitle="elektrotechnika a informatika 2006", year="2006", volume="7", number="1", pages="4", publisher="Západočeská universita v Plzni", isbn="80-7043-473-2" }