Publication detail

Chybí název

ŠIKULA, J.

Original Title

Chybí název

Type

conference paper

Language

English

Original Abstract

Reliability Indicators for Thin and Thick Film Resistors

Authors

ŠIKULA, J.

RIV year

1999

Released

1. 1. 1999

Publisher

Components Technology Institute, Inc.

Location

Huntsville, USA

ISBN

80-01-0195

Book

CARTS 99

Pages from

292

Pages to

296

Pages count

5

BibTex

@inproceedings{BUT214,
  author="Josef {Šikula}",
  title="Chybí název",
  booktitle="CARTS 99",
  year="1999",
  pages="5",
  publisher="Components Technology Institute, Inc.",
  address="Huntsville, USA",
  isbn="80-01-0195"
}