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Publication detail
RŮŽIČKA, R.
Original Title
A Complex Approach to Digital RTL Circuit Testability - iFCoRT System
Type
conference paper
Language
English
Original Abstract
In the paper, a complex approach to the RT level digital circuit diagnostics is presented. This system we call iFCoRT - I path Based, Formally Described and Proved Concept of RTL Digital Circuits Testability. The approach is based on the I path concept and employs Design-for-Testability principles such as Partial Scan etc. Presented approach includes the model of the circuit, testability analysis, testability verification, test scheduling and test controller synthesis. All modules of the system are formally specified and then are, step-by-step, formally proved their correctness.
Keywords
RT level diagnostics, i paths, design-for-testability
Authors
RIV year
2005
Released
23. 5. 2005
Publisher
University of Tallin
Location
Tallinn
Pages from
156
Pages to
157
Pages count
2
BibTex
@inproceedings{BUT21509, author="Richard {Růžička}", title="A Complex Approach to Digital RTL Circuit Testability - iFCoRT System", booktitle="Informal Digest of Papers of the IEEE European Test Symposium 2005", year="2005", pages="156--157", publisher="University of Tallin", address="Tallinn" }