Publication detail

Investigation of 1/f Noise of p-type CdTe Detectors

ANDREEV, A. GRMELA, L.

Original Title

Investigation of 1/f Noise of p-type CdTe Detectors

Type

conference paper

Language

English

Original Abstract

This paper presents the results of experimental studies of transport and noise characteristics of CdTe single crystals. Though no universal mechanism has been identified for flicker noise or 1/f noise, it is the most ubiquitous form of noise in nature. Phenomena that have no obvious connection like heartbeat, cell membrane potential, financial data, DNA sequences and transistors exhibit fluctuations with a 1/f character. As the term "1/f" suggests, a spectral density that increases without limit as frequency decreases, characterizes this kind of noise. Flicker noise in the CdTe single crystals was studied. Two CdTe detectors were used; both have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D).

Keywords

1/f noise; Hooge constant

Authors

ANDREEV, A.; GRMELA, L.

RIV year

2007

Released

1. 5. 2007

Publisher

Dan Pitica

Location

Cluj-Napoca, Romania

ISBN

978-973-713-174-4

Book

30th International Spring Seminar on Electronics Technology 2007

Edition

MEDIAMIRA

Edition number

1

Pages from

88

Pages to

89

Pages count

2

BibTex

@inproceedings{BUT23289,
  author="Alexey {Andreev} and Lubomír {Grmela}",
  title="Investigation of 1/f Noise of p-type CdTe Detectors",
  booktitle="30th International Spring Seminar on Electronics Technology 2007",
  year="2007",
  series="MEDIAMIRA",
  number="1",
  pages="88--89",
  publisher="Dan Pitica",
  address="Cluj-Napoca, Romania",
  isbn="978-973-713-174-4"
}