Publication detail

TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT

PAVLÍK, M. MAGÁT, M. VRBA, R.

Original Title

TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT

Type

conference paper

Language

English

Original Abstract

This paper deals with a design, construction and programming equipment of the tips workplace for chip characteristics measurement. Reason, why the experimental tips workplace of wafer probe was built, is to improve existing laboratory task for education. In the laboratory task the Hall voltage generation on silicon chip placed in the magnetic field was measured. However, new possibilities of use of the tips workplace were revealed

Keywords

tips, measurement, silicon chip

Authors

PAVLÍK, M.; MAGÁT, M.; VRBA, R.

RIV year

2007

Released

12. 8. 2007

Publisher

University of Miskolc, Innovation and Technology Transfer Centre

Location

Miskolc

ISBN

978-963-661-779-0

Book

6th International conference of PhD students

Edition number

první

Pages from

343

Pages to

347

Pages count

5

BibTex

@inproceedings{BUT23389,
  author="Michal {Pavlík} and Martin {Magát} and Radimír {Vrba}",
  title="TIPS WORKPLACE FOR CHIP CHARACTERISTICS MEASUREMENT",
  booktitle="6th International conference of PhD students",
  year="2007",
  number="první",
  pages="343--347",
  publisher="University of Miskolc, Innovation and Technology Transfer Centre",
  address="Miskolc",
  isbn="978-963-661-779-0"
}