Přístupnostní navigace
E-application
Search Search Close
Publication detail
J. Jirák, J. Linhart and V. Neděla
Original Title
Scintillation SE Detector for Variable Pressure Microscopes
Type
conference paper
Language
English
Original Abstract
This paper deals with secondary electrons detection in the ESEM via the entirely new type of scintillation detector. It is shown a way of using scitillation detector in the condition of elevated pressure conditions.
Keywords
secondary electron, environmental scanning electron microscopy, scintillation detector
Authors
RIV year
2006
Released
22. 5. 2006
Publisher
Institute of Scientific Instruments AS CR and the Czechoslovak Microscopy Society
Location
Brno
ISBN
80-239-6285-X
Book
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
Pages from
37
Pages to
38
Pages count
2
BibTex
@inproceedings{BUT24371, author="Josef {Jirák} and Jan {Linhart} and Vilém {Neděla}", title="Scintillation SE Detector for Variable Pressure Microscopes", booktitle="Recent Trends in Charged Particle Optics and Surface Physics Instrumentation", year="2006", volume="10", pages="2", publisher="Institute of Scientific Instruments AS CR and the Czechoslovak Microscopy Society", address="Brno", isbn="80-239-6285-X" }