Publication detail

Observer based position detection of a cantilever in atomic force microscopy

HROUZEK, M.

Original Title

Observer based position detection of a cantilever in atomic force microscopy

Type

conference paper

Language

English

Original Abstract

Application of observer techniques in position detection of thermally disturbed cantilever is able to significantly improve the performance and accuracy of the (interaction) force measurement. In this paper, we propose a detection technique which applies an observer to measure interaction forces of order of pico newtons with standard Atomic Force Microscope. This technique can be a useful tool for non–contact measurement with constant surface interaction.

Key words in English

Observer, Atomic Force Microscopy, Thermal Noise.

Authors

HROUZEK, M.

RIV year

2006

Released

12. 9. 2006

Publisher

VDI/VDE

Location

Heidelberg, Germany

Pages from

1

Pages to

6

Pages count

6

BibTex

@inproceedings{BUT24888,
  author="Michal {Hrouzek}",
  title="Observer based position detection of a cantilever in atomic force microscopy",
  booktitle="IEEE Mechatronics 2006",
  year="2006",
  pages="6",
  publisher="VDI/VDE",
  address="Heidelberg, Germany"
}