Publication detail
Observer based position detection of a cantilever in atomic force microscopy
HROUZEK, M.
Original Title
Observer based position detection of a cantilever in atomic force microscopy
Type
conference paper
Language
English
Original Abstract
Application of observer techniques in position detection of thermally disturbed cantilever is able to significantly improve the performance and accuracy of the (interaction) force measurement. In this paper, we propose a detection technique which applies an observer to measure interaction forces of order of pico newtons with standard Atomic Force Microscope. This technique can be a useful tool for non–contact measurement with constant surface interaction.
Key words in English
Observer, Atomic Force Microscopy, Thermal Noise.
Authors
HROUZEK, M.
RIV year
2006
Released
12. 9. 2006
Publisher
VDI/VDE
Location
Heidelberg, Germany
Pages from
1
Pages to
6
Pages count
6
BibTex
@inproceedings{BUT24888,
author="Michal {Hrouzek}",
title="Observer based position detection of a cantilever in atomic force microscopy",
booktitle="IEEE Mechatronics 2006",
year="2006",
pages="6",
publisher="VDI/VDE",
address="Heidelberg, Germany"
}