Publication detail

Optical methods for extreme level measurement

DREXLER, P. JIRKŮ, T. STEINBAUER, M. FIALA, P.

Original Title

Optical methods for extreme level measurement

Type

conference paper

Language

English

Original Abstract

There are certain optical methods for the measurement of ultra-short solitary electromagnetic pulses or low-level measurement. The measurement methods properties have to correspond to the fact of whether we want to measure pulses of voltage, current or a free-space electromagnetic wave. The need for specific measurement methods occurred owing to the development of high power microwave pulse generator. Certain applicable methods are presented in this paper. For the same purpose, the magneto-optic method can be utilized with respect to its advantages. For the measurement of the output microwave pulse of the generator, the optical method was designed and realized. Low-level optical measurement methods were used for nano-layers measurement and experimentally verified with regard to air ion concentration test.

Keywords

optical methods, extreme level measurement, magnetooptic effect, electrooptic effect, ion measurement

Authors

DREXLER, P.; JIRKŮ, T.; STEINBAUER, M.; FIALA, P.

RIV year

2007

Released

8. 6. 2007

Publisher

IEEE

Location

Pisa, Italy

ISBN

1-4244-1276-5

Book

2007 International Waveform Diversity and Design Conference

Pages from

131

Pages to

135

Pages count

5

BibTex

@inproceedings{BUT25606,
  author="Petr {Drexler} and Tomáš {Jirků} and Miloslav {Steinbauer} and Pavel {Fiala}",
  title="Optical methods for extreme level measurement",
  booktitle="2007 International Waveform Diversity and Design Conference",
  year="2007",
  pages="131--135",
  publisher="IEEE",
  address="Pisa, Italy",
  isbn="1-4244-1276-5"
}