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Publication detail
ŠKARVADA, P.
Original Title
Solar cell surface local reflaction and pn junction area measurement
Type
conference paper
Language
English
Original Abstract
The objective of this paper is focused on study of solar cell parameters by advanced microscopy methods. Scanning Near-field Optical Microscopy (SNOM) is very useful modern tool for sample topography and surface reflectivity measurements. Using this, it is possible to determine pn junction area, localize some structure errors and investigate sample surface with submicron even subwavelength details. Accurate value of pn junction area is important parameter of solar cells, which is used for barrier capacitance calculations and improvement of solar cell effective value.
Keywords
Scanning near-field optical microscopy, solar cell, pn junction area, local reflection
Authors
RIV year
2008
Released
24. 4. 2008
Publisher
Ing. Zdeněk Novotný CSc.
Location
Brno
ISBN
978-80-214-3617-6
Book
Proceedings of the 14th conference Student EEICT 2008 volume 4
Edition number
1
Pages from
317
Pages to
321
Pages count
4
BibTex
@inproceedings{BUT26339, author="Pavel {Škarvada}", title="Solar cell surface local reflaction and pn junction area measurement", booktitle="Proceedings of the 14th conference Student EEICT 2008 volume 4", year="2008", number="1", pages="317--321", publisher="Ing. Zdeněk Novotný CSc.", address="Brno", isbn="978-80-214-3617-6" }