Publication detail

TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path

STRNADEL, J.

Original Title

TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a customer. Estimation of testability parameter strongly depends on how accurate information utilized for the estimation by a testability analysis method is. In the paper, two results of our previous, long-term research in the area of digital circuit testability analysis are summarized: principle of our testability analysis engine and libraries used to store the information outgoing from transparency models. The engine is general and the run-time and accuracy of its results strongly depends on the information stored in the libraries. If simple transparency model is utilized, information about circuit testability could be far away from real state of the circuit. Otherwise, testability information can approximate so serious parameter such as fault-coverage factor.

Keywords

digital, circuit, testability, analysis, scan, transparency, netlist, graph, model, searching, marking, reachability, library, component, template

Authors

STRNADEL, J.

RIV year

2008

Released

2. 6. 2008

Publisher

IEEE Computer Society

Location

Los Alamitos

ISBN

978-0-7695-3277-6

Book

Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools

Pages from

865

Pages to

872

Pages count

8

URL

https://www.fit.vut.cz/research/publication/8632/

BibTex

@inproceedings{BUT27714,
  author="Josef {Strnadel}",
  title="TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path",
  booktitle="Proceedings of 11th Euromicro Conference on Digital Systems Design Architectures, Methods and Tools",
  year="2008",
  pages="865--872",
  publisher="IEEE Computer Society",
  address="Los Alamitos",
  isbn="978-0-7695-3277-6",
  url="https://www.fit.vut.cz/research/publication/8632/"
}