Publication detail

Low Frequency Noise Measuring in Semiconductor Devices

ANDREEV, A. ZAJAČEK, J. GRMELA, L. HOLCMAN, V.

Original Title

Low Frequency Noise Measuring in Semiconductor Devices

Type

conference paper

Language

English

Original Abstract

The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.

Keywords

Low frequency noise, polovodic

Authors

ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V.

RIV year

2007

Released

12. 8. 2007

Publisher

Dr. Laszlo Lehoczky

Location

Miskolc, Hungary

ISBN

978-963-661-783-7

Book

6th International Conference of PhD Students

Edition

Dr. Laszlo Lehoczky

Edition number

1

Pages from

179

Pages to

184

Pages count

6

BibTex

@inproceedings{BUT28507,
  author="Alexey {Andreev} and Jiří {Zajaček} and Lubomír {Grmela} and Vladimír {Holcman}",
  title="Low Frequency Noise Measuring in Semiconductor Devices",
  booktitle="6th International Conference of PhD Students",
  year="2007",
  series="Dr. Laszlo Lehoczky",
  number="1",
  pages="179--184",
  publisher="Dr. Laszlo Lehoczky",
  address="Miskolc, Hungary",
  isbn="978-963-661-783-7"
}