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HAVRÁNEK, J. ŠIKULA, J. PAVELKA, J. GRMELA, L.
Original Title
RTS noise - carrier capture and emission event duration
Type
conference paper
Language
English
Original Abstract
The analysis of RTS in this paper quantitatively explains details of charge carriers trapping and detrapping processes in MOS structures. The emphasis is on those RTS showing a capture process, which deviates from the standard Shockley-Read-Hall kinetics. With a shorter observation time (number of RTS pulses - 7x105) the capture and emission time constants exactly follow an inverse carrier density dependence predicted by the standard Shockley-Read-Hall kinetics (SRH). On the other hand, with longer observation times (the number of pulses - 15x106 - more than 30 hours), the second emission process, which continues a parallel with the capture process ?c, is observed and simple SRH theory is disclaimed. Thus was proved that the occupation time probability density for the emission is given by a superposition of two exponential dependencies, whereas the capture time constant distribution is purely exponential. The distributions of the times in the 'high' and 'low' states according to SRH kinetics are exponential, in semi-logarithmic plot the histograms of the 'high' and 'low' states has the linear decay.
Keywords
RTS noise, capture time, emission time, SRH kinetic
Authors
HAVRÁNEK, J.; ŠIKULA, J.; PAVELKA, J.; GRMELA, L.
RIV year
2007
Released
16. 11. 2007
Publisher
VUT Brno
Location
Brno
ISBN
978-80-7355-078-3
Book
New trends in Physics
Edition
VUT
Edition number
1
Pages from
31
Pages to
34
Pages count
4
BibTex
@inproceedings{BUT28534, author="Jan {Havránek} and Josef {Šikula} and Jan {Pavelka} and Lubomír {Grmela}", title="RTS noise - carrier capture and emission event duration", booktitle="New trends in Physics", year="2007", series="VUT", number="1", pages="31--34", publisher="VUT Brno", address="Brno", isbn="978-80-7355-078-3" }