Publication detail

Scintillation secondary electron detector for variable pressure scanning electron microscope

ČUDEK, P.

Original Title

Scintillation secondary electron detector for variable pressure scanning electron microscope

Type

conference paper

Language

English

Original Abstract

This work deals with optimalization of the electrode system of the experimental secondary electron detector for variable pressure sem for different pressure of vater vapours in the specimen chamber.

Keywords

Scanning electron microscope (SEM), environmental scanning electron microscope (ESEM), scintillation detector (SD), secondary electrons (SE). variable pressure scanning electron microscope (VP-SEM)

Authors

ČUDEK, P.

RIV year

2010

Released

29. 4. 2010

Location

Brno

ISBN

978-80-214-4079-1

Book

Proceedings of the 16th conference student EEICT 2010

Edition

první

Edition number

4

Pages from

189

Pages to

193

Pages count

250

BibTex

@inproceedings{BUT29560,
  author="Pavel {Čudek}",
  title="Scintillation secondary electron detector for variable pressure scanning electron microscope",
  booktitle="Proceedings of the 16th conference student EEICT 2010",
  year="2010",
  series="první",
  number="4",
  pages="189--193",
  address="Brno",
  isbn="978-80-214-4079-1"
}