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ŠKARVADA, P. GRMELA, L. ABUETWIRAT, I. TOMÁNEK, P.
Original Title
Nanooptics of locally induced photocurrent in monocrystalline Si solar cells
Type
conference paper
Language
English
Original Abstract
This paper presents the results of our experimental study of high resolution map of induced photocurrent in monocrystalline silicon solar cells. Photovoltaic solar cells are evaluated by Near-field Optical Beam Induced photocurrent (NOBIC), as well as by Scanning Near-field Optical Microscope (SNOM) topography and reflection. The correlation between reflection and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM and NOBIC represent the coupling of very useful methods to provide a non-destructive local characterization on silicon semiconductor solar cells.
Keywords
monocrystalline Si, solar cell, locally induced photocurrent
Authors
ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P.
RIV year
2008
Released
17. 11. 2008
Publisher
SPIE
Location
Bellingham, USA
ISBN
978-0-8194-7379-0
Book
Photonics, Devices and Systems - Proceedings of SPIE vol.7138
Edition number
7138
0277-786X
Periodical
Proceedings of SPIE
Year of study
Number
State
United States of America
Pages from
2901
Pages to
2906
Pages count
6
BibTex
@inproceedings{BUT29806, author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}", title="Nanooptics of locally induced photocurrent in monocrystalline Si solar cells", booktitle="Photonics, Devices and Systems - Proceedings of SPIE vol.7138", year="2008", journal="Proceedings of SPIE", volume="7138", number="7138", pages="2901--2906", publisher="SPIE", address="Bellingham, USA", isbn="978-0-8194-7379-0", issn="0277-786X" }