Publication detail

Analysis of back side contact imaging phenomenon in LBIC

VESELÝ, A.

Original Title

Analysis of back side contact imaging phenomenon in LBIC

Type

conference paper

Language

English

Original Abstract

This paper deals with analysis of back side imagining of solar cells phenomenon. By usage of light radiation generated by UV LED with average wave length 400 nm photons penetrate to the depth about 0.1 m, which is an area before PN junction tested photovoltaic cell. The generated pairs of electron-hole are affected by various recombinations mostly by the surface recombination. On the figure is shown back side grid (Fig. 1) taken by the UV LED LBIC.

Keywords

back side contact, imaging, solar cell, LBIC

Authors

VESELÝ, A.

RIV year

2009

Released

23. 4. 2009

Publisher

NOVPRESS s.r.o.

Location

Brno

ISBN

978-80-214-3870-5

Book

Proceedings of the 15.th conference Student EEICT, volume 3

Edition number

1

Pages from

223

Pages to

226

Pages count

4

BibTex

@inproceedings{BUT30267,
  author="Aleš {Veselý}",
  title="Analysis of back side contact imaging phenomenon in LBIC",
  booktitle="Proceedings of the 15.th conference Student EEICT, volume 3",
  year="2009",
  number="1",
  pages="223--226",
  publisher="NOVPRESS s.r.o.",
  address="Brno",
  isbn="978-80-214-3870-5"
}