Publication detail

Fast impedance spectroscopy method for insulating layers with very high impedance

SCHAUER, P.

Original Title

Fast impedance spectroscopy method for insulating layers with very high impedance

Type

conference paper

Language

English

Original Abstract

The paper presents a fast impedance spectroscopy method for objects with very high impedance |Zx| ? 1G? modeled by RC networks. The method is suitable for predicting lifetime and reliability of insulating materials. Fast impedance spectroscopy method was tested on the insulating layers, which were part of the system metal-insulator-metal (MIM). Method is based on measurements of the power loss and phase shift in the AC voltage divider, which consists of measured system MIM and of the known impedance. Computer controlled instruments measure the gain and phase shift between the two outputs of alternating electrical circuit and computer program calculates parameters of impedance spectroscopy from this values. The outputs are the graphical and tabular impedance characteristics of the MIM system, namely: the dielectric loss of the insulating film, imaginary part of impedance, loss factor, parallel resistance Rp and capacity Cp of MIM system, all frequency dependent. Frequency characteristics provide an analysis of loss mechanisms that may affect the quality and reliability of the insulating layers.

Keywords

impedance spectroscopy

Authors

SCHAUER, P.

RIV year

2009

Released

25. 11. 2009

Publisher

CERM

Location

Brno

ISBN

978-80-7204-671-3

Book

7th workshop NDT 2009, non-destructive testing in engineering practice

Pages from

80

Pages to

87

Pages count

8

BibTex

@inproceedings{BUT32963,
  author="Pavel {Schauer}",
  title="Fast impedance spectroscopy method for insulating layers with very high impedance",
  booktitle="7th workshop NDT 2009, non-destructive testing in engineering practice",
  year="2009",
  pages="80--87",
  publisher="CERM",
  address="Brno",
  isbn="978-80-7204-671-3"
}