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ŠKARVADA, P. TOMÁNEK, P.
Original Title
Reverse-biased solar cell light emission thermal dependency
Type
conference paper
Language
English
Original Abstract
We present experimental data of light emission measurement from reverse-biased monocrystalline solar cell samples. Using high sensitivity light detection technique (cooled PMT in photon counting regime), some spots appearing in low reverse voltage Ur = 1.9 V have been found. Thermal dependency of light emission from bulk and edge defects shows different characteristics, respectively. Therefore not all of the light emitting spots in visible range are connected with avalanche multiplication or microplasmas. This measurement proves that all defects in the cell are not of the same nature.
Keywords
Solar cell, light emission, thermal dependency
Authors
ŠKARVADA, P.; TOMÁNEK, P.
RIV year
2010
Released
2. 9. 2010
Publisher
Novpress
Location
Brno
ISBN
978-80-214-4138-5
Book
Electronic Devices and Systems EDS10
Pages from
304
Pages to
307
Pages count
4
BibTex
@inproceedings{BUT35589, author="Pavel {Škarvada} and Pavel {Tománek}", title="Reverse-biased solar cell light emission thermal dependency", booktitle="Electronic Devices and Systems EDS10", year="2010", pages="304--307", publisher="Novpress", address="Brno", isbn="978-80-214-4138-5" }